Controlled Electron Channeling Contrast Imaging In Scanning Electron Microscopy

We are thrilled to invite you to our upcoming webinar,"Controlled Electron Channeling Contrast Imaging (cECCI): In Scanning Electron Microscopy", taking place on August 27. This webinar explores how cECCI enables the visualization of crystallographic defects such as dislocations and stacking faults in bulk materials using SEM technology.

Join our expert to learn about:

• The fundamentals of electron channeling contrast imaging,
• How to observe crystal lattice defects in bulk samples with SEM,
• Benefits of cECCI compared to traditional TEM-based approaches
• The role of advanced SEM and crystallographic analysis software in achieving optimal results.

Don’t miss the opportunity to see practical examples, hear application insights, and ask your questions live.

Learn more and reserve your place here.